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ABOUT US

Metrosol’s state-of-the-art thin film measurement systems solve the needs of next-generation semiconductor manufacturing. The introduction of new semiconductor materials coupled with ever-shrinking feature sizes will soon make current metrology technologies limited in usefulness. Metrosol’s short wavelength metrology solution enables better and tighter process control on product wafers and at a throughput suitable for high-volume manufacturing.

Metrosol brings a unique and required capability to market for the semiconductor industry and continues to grow its patent portfolio.  Our Short Wavelength Optical Metrology technology is the only commercially available system in the world that collects data in the vacuum ultraviolet wavelength region down to 120nm. This technology can help save semiconductor manufacturers a significant amount of money each year by detecting process excursions on product wafers.

Based in Austin, Texas, Metrosol is a cohesive team of top-level scientists, sales/marketing personnel and executives with extensive experience in the semiconductor and other high-technology industries. In addition, Metrosol is supported by a dedicated group of industry experienced board members and investors.